Supplemental material for Treatment of Surface Plasmon Resonance (SPR) Background in Total Internal Reflection Ellipsometry: Characterization of RNA Polymerase II Film Formation

Supplemental Material for Treatment of Surface Plasmon Resonance (SPR) Background in Total Internal Reflection Ellipsometry: Characterization of RNA Polymerase II Film Formation by Dušan Hemzal, Yu Ri Kang, Jan Dvořák, Tomasz Kabzinski, Karel Kubíček, Young Dong Kim and Josef Humlíček in Applied Spectroscopy