Supplemental material for Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance

Velez, Raymond A.; Lavrik, Nickolay V.; Kravchenko, Ivan I.; Sepaniak, Michael J.; Jesus, Marco A. De

doi:10.25384/SAGE.8185886.v1

Supplemental_Material.pdf (1.28 MB)

Supplemental material for Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance

journal contribution

posted on 2019-05-20, 12:00 authored by Raymond A. Velez, Nickolay V. Lavrik, Ivan I. Kravchenko, Michael J. Sepaniak, Marco A. De Jesus

Supplemental Material for Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance by Raymond A. Velez, Nickolay V. Lavrik, Ivan I. Kravchenko, Michael J. Sepaniak and Marco A. De Jesus in Applied Spectroscopy